Khan, SeyabSeyabKhanHaron, Nor ZaidiNor ZaidiHaronHamdioui, SaidSaidHamdiouiCatthoor, FranckyFranckyCatthoor2021-10-192021-10-192011https://imec-publications.be/handle/20.500.12860/19170NBTI monitoring and design for reliability in nanoscale circuitsProceedings paper