Schanovsky, F.F.SchanovskyVerreck, DevinDevinVerreckStanojevic, Z.Z.StanojevicSchallert, S.S.SchallertArreghini, AntonioAntonioArreghiniVan den Bosch, GeertGeertVan den BoschRosmeulen, MaartenMaartenRosmeulenKarner, M.M.Karner2024-02-262024-01-072024-02-2620240018-9383WOS:001129749200001https://imec-publications.be/handle/20.500.12860/43341Modeling the Operation of Charge Trap Flash Memory–Part I: The Importance of Carrier Energy RelaxationJournal article10.1109/TED.2023.3339076WOS:001129749200001TRANSPORTDEVICES