Carrier lifetime dependence on doping, metal implants and excitation density in Ge and Si

Gaubas, E.E.GaubasVanhellemont, J.J.VanhellemontSimoen, EddyEddySimoenRomandic, I.I.RomandicGeens, W.W.GeensClauws, P.P.Clauws2021-10-162021-10-162007https://imec-publications.be/handle/20.500.12860/12183Carrier lifetime dependence on doping, metal implants and excitation density in Ge and SiJournal article