Temperature and oxide tickness influence on the generation lifetime determination in partially depleted SOI nMOSFETs

Galeti, M.M.GaletiMartino, J.A.J.A.MartinoSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-162021-10-162005https://imec-publications.be/handle/20.500.12860/10477Temperature and oxide tickness influence on the generation lifetime determination in partially depleted SOI nMOSFETsProceedings paper