Pavanello, M.A.M.A.PavanelloMartino, J.A.J.A.MartinoSimoen, EddyEddySimoenRooyackers, RitaRitaRooyackersCollaert, NadineNadineCollaertClaeys, CorCorClaeys2021-10-172021-10-1720080038-1101https://imec-publications.be/handle/20.500.12860/14289Analog performance of standard and strained triple-gate nFINFETSJournal article