Mertens, PaulPaulMertensVermeire, BertBertVermeireDepas, MichelMichelDepasMeuris, MarcMarcMeurisHeyns, MarcMarcHeynsGräf, D.D.Gräf2021-09-292021-09-291994https://imec-publications.be/handle/20.500.12860/249Statistical analysis of gate oxide integrity testProceedings paper