Study of the stability of e-mode GaN HEMTs with p-GaN gate based on combined DC and optical analysis

Rossetto, IsabellaIsabellaRossettoMeneghini, MatteoMatteoMeneghiniRizzato, VanessaVanessaRizzatoRuzzarin, MariaMariaRuzzarinFavaron, AndreaAndreaFavaronStoffels, SteveSteveStoffelsVan Hove, MarleenMarleenVan HovePosthuma, NielsNielsPosthumaWu, Tian-LiTian-LiWuMarcon, DenisDenisMarconDecoutere, StefaanStefaanDecoutereMeneghesso, GaudenzioGaudenzioMeneghessoZanoni, EnricoEnricoZanoni2021-10-232021-10-2320160026-2714https://imec-publications.be/handle/20.500.12860/27239Study of the stability of e-mode GaN HEMTs with p-GaN gate based on combined DC and optical analysisJournal articlehttp://www.sciencedirect.com/science/article/pii/S0026271416302712