Oxidation behavior of Ni thin films: application to NiO-based ReRAM

Lisoni, JuditJuditLisoniGoux, LudovicLudovicGouxVerleysen, EvelineEvelineVerleysenWang, Xin PengXin PengWangJurczak, GosiaGosiaJurczakWouters, DirkDirkWouters2021-10-182021-10-182009https://imec-publications.be/handle/20.500.12860/15729Oxidation behavior of Ni thin films: application to NiO-based ReRAMMeeting abstract