Meng, D.D.MengZhang, J. F.J. F.ZhangZhang, J. C.J. C.ZhangZhang, W.W.ZhangJi, Z.Z.JiBenbakhti, B.B.BenbakhtiZheng, X. F.X. F.ZhengHao, Y.Y.HaoVigar, D.D.VigarAdamu-Lema, F.F.Adamu-LemaChandra, V.V.ChandraAitken, R.R.AitkenKaczer, BenBenKaczerGroeseneken, GuidoGuidoGroesenekenAsenov, A.A.Asenov2021-10-242021-10-242017https://imec-publications.be/handle/20.500.12860/28963Interaction between hot carrier aging and PBTI degradation in nMOSFETs: characterization, modelling and lifetime predictionProceedings paperhttp://ieeexplore.ieee.org/document/7936419/