Constant current charge-to-breakdown: still a valid tool to study the reliability of MOS structures

Nigam, TanyaTanyaNigamDegraeve, RobinRobinDegraeveGroeseneken, GuidoGuidoGroesenekenHeyns, MarcMarcHeynsMaes, HermanHermanMaes2021-10-012021-10-011998https://imec-publications.be/handle/20.500.12860/2806Constant current charge-to-breakdown: still a valid tool to study the reliability of MOS structuresProceedings paper