Ronchi, NicoloNicoloRonchiMcMitchell, SeanSeanMcMitchellMin, JinhongJinhongMinBanerjee, KaustuvKaustuvBanerjeeVan den Bosch, GeertGeertVan den BoschShin, ChanghwanChanghwanShinVan Houdt, JanJanVan Houdt2021-10-292021-10-292020https://imec-publications.be/handle/20.500.12860/35853Endurance of ferroelectric La-doped HfO2 for SFS gate-stack memory devicesProceedings paperhttps://ieeexplore.ieee.org/document/9108125