Ohyama, HidenoriHidenoriOhyamaVanhellemont, JanJanVanhellemontTakami, Y.Y.TakamiHayama, KiyoteruKiyoteruHayamaSunaga, H.H.SunagaNahsiyama, I.I.NahsiyamaOwatoko, Y.Y.OwatokoPoortmans, JefJefPoortmansCaymax, MattyMattyCaymax2021-09-302021-09-301997https://imec-publications.be/handle/20.500.12860/2074Degradation of SiGe devices by proton irradiationProceedings paper