Eyben, PierrePierreEybenArutchelvan, GouthamGouthamArutchelvanChiarella, ThomasThomasChiarellaArimura, HiroakiHiroakiArimuraRitzenthaler, RomainRomainRitzenthalerMitard, JeromeJeromeMitardDentoni Litta, EugenioEugenioDentoni LittaHoriguchi, NaotoNaotoHoriguchiGoux, LudovicLudovicGoux2024-01-182022-08-102024-01-182022-09N/Ahttps://imec-publications.be/handle/20.500.12860/40240Investigation of access resistance components in Si-channel p-FinFET using cascaded devices.Meeting abstract