A comprehensive model for hot carrier degradation in LDMOS transistors

Moens, P.P.MoensMertens, JanJanMertensBauwens, F.F.BauwensJoris, P.P.JorisDe Ceuninck, WardWardDe CeuninckTack, M.M.Tack2021-10-162021-10-162007https://imec-publications.be/handle/20.500.12860/12585A comprehensive model for hot carrier degradation in LDMOS transistorsProceedings paper