Debucquoy, MaartenMaartenDebucquoyVerlaak, StijnStijnVerlaakSteudel, SoerenSoerenSteudelMyny, KrisKrisMynyGenoe, JanJanGenoeHeremans, PaulPaulHeremans2021-10-162021-10-162007-09https://imec-publications.be/handle/20.500.12860/12021Correlation between bias stress instability and phototransistor operation of pentacene thin-film transistorsJournal article