Radiation damage of n-MOSFETs fabricated in a BiCMOS process

Ohyama, HidenoriHidenoriOhyamaKobayashi, K.K.KobayashiNakabayashi, M.M.NakabayashiSimoen, EddyEddySimoenClaeys, CorCorClaeysTakami, Y.Y.TakamiYoneoka, M.M.YoneokaHayama, KiyoteruKiyoteruHayamaTakizawa, H.H.TakizawaKohiki, S.S.Kohiki2021-10-142021-10-142000https://imec-publications.be/handle/20.500.12860/4635Radiation damage of n-MOSFETs fabricated in a BiCMOS processProceedings paper