Failure rate prediction and accelerated detection of anomalous charge loss in flash memories by using an analytical transient physics-based charge loss model

Schuler, FranzFranzSchulerTempel, GeorgGeorgTempelMelzner, H.H.MelznerJacob, M.M.JacobHendrickx, PaulPaulHendrickxWellekens, DirkDirkWellekensVan Houdt, JanJanVan Houdt2021-10-142021-10-142002https://imec-publications.be/handle/20.500.12860/6813Failure rate prediction and accelerated detection of anomalous charge loss in flash memories by using an analytical transient physics-based charge loss modelJournal article