Impact of the back-gate bias on the low-frequency noise of fully depleted silicon-on-insulator MOSFETs

Simoen, EddyEddySimoenMercha, AbdelkarimAbdelkarimMerchaClaeys, CorCorClaeysLukyanchikova, N.N.LukyanchikovaGarbar, N.N.Garbar2021-10-152021-10-152003https://imec-publications.be/handle/20.500.12860/8147Impact of the back-gate bias on the low-frequency noise of fully depleted silicon-on-insulator MOSFETsProceedings paper