A new method for the analysis of high-resolution SILC data

Aresu, StefanoStefanoAresuDe Ceuninck, WardWardDe CeuninckKnuyt, G.G.KnuytMertens, JanJanMertensManca, JeanJeanMancaDe Schepper, LucLucDe SchepperDegraeve, RobinRobinDegraeveKaczer, BenBenKaczerD'Olieslaeger, MarcMarcD'OlieslaegerD'Haen, JanJanD'Haen2021-10-152021-10-152003https://imec-publications.be/handle/20.500.12860/7145A new method for the analysis of high-resolution SILC dataJournal article