Combined reflectometry-ellipsometry technique to measure graphite down to monolayer thickness

Wang, Wei-EWei-EWangBalooch, M.M.BaloochClaypool, C.C.ClaypoolZawaideh, M.M.ZawaidehFarnaam, K.K.Farnaam2021-10-182021-10-1820090038-111Xhttps://imec-publications.be/handle/20.500.12860/16526Combined reflectometry-ellipsometry technique to measure graphite down to monolayer thicknessJournal article