Calibrated wafer-level HBM measurements for quasi-static and transient device analysis

Scholz, MirkoMirkoScholzThijs, StevenStevenThijsLinten, DimitriDimitriLintenTremouilles, DavidDavidTremouillesSawada, MasanoriMasanoriSawadaNakaei, T.T.NakaeiHasebe, TakumiTakumiHasebeNatarajan, M.I.M.I.NatarajanGroeseneken, GuidoGuidoGroeseneken2021-10-162021-10-162007https://imec-publications.be/handle/20.500.12860/12857Calibrated wafer-level HBM measurements for quasi-static and transient device analysisProceedings paper