Petrescu, VioletaVioletaPetrescuMouthaan, T.T.MouthaanSchoenmaker, WimWimSchoenmakerAngelescu, SerbanSerbanAngelescuVissarion, R.R.VissarionDima, G.G.DimaWallinga, H.H.WallingaProfirescu, M. D.M. D.Profirescu2021-09-292021-09-291995https://imec-publications.be/handle/20.500.12860/820Numerical analysis of electromigration in thin film VLSI interconnectionsProceedings paper