Factors determining the damage coefficient and the low-frequency noise in MeV proton-irradiated silicon diodes

Simoen, EddyEddySimoenClaeys, CorCorClaeysOhyama, HidenoriHidenoriOhyama2021-10-012021-10-011998https://imec-publications.be/handle/20.500.12860/2949Factors determining the damage coefficient and the low-frequency noise in MeV proton-irradiated silicon diodesJournal article