Vaisman Chasin, AdrianAdrianVaisman ChasinFranco, JacopoJacopoFrancoBury, ErikErikBuryRitzenthaler, RomainRomainRitzenthalerDentoni Litta, EugenioEugenioDentoni LittaSpessot, AlessioAlessioSpessotHoriguchi, NaotoNaotoHoriguchiLinten, DimitriDimitriLintenKaczer, BenBenKaczer2022-01-202021-11-022022-01-202022-01-2020201541-7026WOS:000612717200167https://imec-publications.be/handle/20.500.12860/38209Relevance of fin dimensions and high-pressure anneals on hot-carrier degradationProceedings paper978-1-7281-3199-3WOS:000612717200167RELIABILITY