Guo, JinJinGuoPapanikolaou, AntonisAntonisPapanikolaouStucchi, MicheleMicheleStucchiCroes, KristofKristofCroesTokei, ZsoltZsoltTokeiCatthoor, FranckyFranckyCatthoor2021-10-172021-10-172008https://imec-publications.be/handle/20.500.12860/13824A tool flow for predicting system level timing failures due to interconnect reliability degradationProceedings paper