Andries, E.E.AndriesDreesen, R.R.DreesenCroes, K.K.CroesDe Ceuninck, WardWardDe CeuninckDe Schepper, LucLucDe SchepperGroeseneken, GuidoGuidoGroesenekenLo, K.F.K.F.LoD'Olieslaeger, MarcMarcD'OlieslaegerD'Haen, JanJanD'Haen2021-10-142021-10-142002https://imec-publications.be/handle/20.500.12860/5957Statistical aspects of the degradation of LDD nMOSFETsJournal article