Cho, Moon JuMoon JuChoAoulaiche, MarcMarcAoulaicheDegraeve, RobinRobinDegraeveKaczer, BenBenKaczerKauerauf, ThomasThomasKaueraufRagnarsson, Lars-AkeLars-AkeRagnarssonAdelmann, ChristophChristophAdelmannVan Elshocht, SvenSvenVan ElshochtHoffmann, Thomas Y.Thomas Y.HoffmannGroeseneken, GuidoGuidoGroeseneken2021-10-192021-10-1920110038-1101https://imec-publications.be/handle/20.500.12860/18691Advanced PBTI reliability with 0.69nm EOT GdHfO gate dielectricJournal article