Crupi, F.F.CrupiMagnone, P.P.MagnoneIannacone, G.G.IannaconeGiusi, G.G.GiusiPace, C.C.PaceSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-172021-10-172008https://imec-publications.be/handle/20.500.12860/13573Modeling the gate current 1/f noise and its application to advanced CMOS devicesProceedings paper