Ohyama, HidenoriHidenoriOhyamaSimoen, EddyEddySimoenClaeys, CorCorClaeysTakami, Y.Y.TakamiKawamura, K.K.KawamuraHakata, T.T.HakataSunaga, H.H.SunagaOgita, Y.Y.Ogita2021-09-302021-09-301997https://imec-publications.be/handle/20.500.12860/2069Degradation and recovery of alpha ray irradiated MOSFETs on SIMOXProceedings paper