A yield-aware modeling methodology for nano-scaled SRAM designs

Grossar, EvelynEvelynGrossarCroon, JeroenJeroenCroonStucchi, MicheleMicheleStucchiDehaene, WimWimDehaeneMaex, KarenKarenMaex2021-10-162021-10-162005https://imec-publications.be/handle/20.500.12860/10531A yield-aware modeling methodology for nano-scaled SRAM designsProceedings paper