Efficient reliability testing of emerging memory technologies using multiple radiation sources

Bennet, W.G.W.G.BennetHooten, N.C.N.C.HootenWeeded-Wright, S.S.Weeded-WrightSchrimpf, R.D.R.D.SchrimpfReed, R.A.R.A.ReedAlles, M.C.M.C.AllesZhang, E.X.E.X.ZhangMc Curdy, M.W.M.W.Mc CurdyLinten, DimitriDimitriLintenJurczak, GosiaGosiaJurczakFantini, AndreaAndreaFantini2021-10-222021-10-222014https://imec-publications.be/handle/20.500.12860/23535Efficient reliability testing of emerging memory technologies using multiple radiation sourcesProceedings paper