Muhonen, KathleenKathleenMuhonenAshton, RobertRobertAshtonSmedes, TheoTheoSmedesScholz, MirkoMirkoScholzVelghe, RudolfRudolfVelghePeachey, NathanielNathanielPeacheyBarth, JonJonBarthStadler, WolfgangWolfgangStadlerGrund, EvanEvanGrund2021-10-202021-10-202012-09https://imec-publications.be/handle/20.500.12860/21173HMM round robin study: What to expect when testing components to the IEC 61000-4-2 waveformProceedings paper