Ji, Z.Z.JiHatta, S. F. W. M.S. F. W. M.HattaZhang, J. F.J. F.ZhangMa, G. M.G. M.MaZhang, W.W.ZhangSoin, N.N.SoinKaczer, BenBenKaczerDe Gendt, StefanStefanDe GendtGroeseneken, GuidoGuidoGroeseneken2021-10-212021-10-212013https://imec-publications.be/handle/20.500.12860/22551Negative bias temperature instability lifetime prediction: problems and solutionsProceedings paper