Marinissen, Erik JanErik JanMarinissenChi, Chun-ChuanChun-ChuanChiVerbree, JoukeJoukeVerbreeKonijnenburg, MarioMarioKonijnenburg2021-10-182021-10-182010-11https://imec-publications.be/handle/20.500.12860/17583An IEEE Std 1500-based 3D design-for-test architectureProceedings paper