Competing degradation mechanisms in short-channel transistors under channel hot-carrier stress at elevated temperatures

Amat, EsteveEsteveAmatKauerauf, ThomasThomasKaueraufDegraeve, RobinRobinDegraeveRodríguez, RosanaRosanaRodríguezNafría, MontseMontseNafríaAymerich, XavierXavierAymerichGroeseneken, GuidoGuidoGroeseneken2021-10-172021-10-1720091530-4388https://imec-publications.be/handle/20.500.12860/14897Competing degradation mechanisms in short-channel transistors under channel hot-carrier stress at elevated temperaturesJournal article