Schweinbock, T.T.SchweinbockSchömann, S.S.SchömannAlvarez, DavidDavidAlvarezBuzzo, M.M.BuzzoFrammelsberger, W.W.FrammelsbergerBreitschopf, P.P.BreitschopfBenstetter, G.G.Benstetter2021-10-152021-10-152004https://imec-publications.be/handle/20.500.12860/9576New trends in the application of scanning probe techniques in failure analysisJournal article