Dubuc, Jean-PaulJean-PaulDubucSimoen, EddyEddySimoenVasina, PetrPetrVasinaClaeys, C.C.Claeys2021-09-292021-09-291995https://imec-publications.be/handle/20.500.12860/636Low-frequency noise behaviour of high-energy electron irradiated Si n+p junction diodesJournal article