Results of low-frequency noise in submicron nMOSFETs processed by a 0.35mm CMOS technology

Lukyanchikova, N. B.N. B.LukyanchikovaPetrichuk, M. V.M. V.PetrichukGarbar, N. P.N. P.GarbarSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-09-292021-09-291996https://imec-publications.be/handle/20.500.12860/1332Results of low-frequency noise in submicron nMOSFETs processed by a 0.35mm CMOS technologyProceedings paper