Vandervorst, WilfriedWilfriedVandervorstEyben, PierrePierreEybenAlvarez, DavidDavidAlvarezDuhayon, NatasjaNatasjaDuhayonXu, MingweiMingweiXuClarysse, TrudoTrudoClarysse2021-10-142021-10-142002https://imec-publications.be/handle/20.500.12860/6985Two-dimensional carrier profiling with scanning probesOral presentation