Efficient mode-matching analysis of discontinuities in finite planar substrates using perfectly matched layers

Derudder, H.H.DerudderOlyslager, FrankFrankOlyslagerDe Zutter, DanielDanielDe ZutterVan den Berghe, S.S.Van den Berghe2021-10-142021-10-142001https://imec-publications.be/handle/20.500.12860/5241Efficient mode-matching analysis of discontinuities in finite planar substrates using perfectly matched layersJournal article