Tang, BaojunBaojunTangCroes, KristofKristofCroesSimoen, EddyEddySimoenBeyne, SofieSofieBeyneAdelmann, ChristophChristophAdelmannTokei, ZsoltZsoltTokei2021-10-222021-10-222015https://imec-publications.be/handle/20.500.12860/25981Experimental validation of electromigration by low frequency noise measurement for advanced interconnects applicationProceedings paperhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7288613