Bina, MarkusMarkusBinaTriebl, O.O.TrieblKarner, M.M.KarnerKaczer, BenBenKaczerGrasser, TiborTiborGrasser2021-10-202021-10-202012https://imec-publications.be/handle/20.500.12860/20365Simulation of rReliability of nanoscale devicesProceedings paper