Reliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system design

Papanikolaou, AntonisAntonisPapanikolaouWang, HuaHuaWangMiranda Corbalan, MiguelMiguelMiranda CorbalanCatthoor, FranckyFranckyCatthoor2021-10-162021-10-162007-07https://imec-publications.be/handle/20.500.12860/12673Reliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system designProceedings paper