Pavanello, M. A.M. A.PavanelloMartino, J. A.J. A.MartinoSimoen, EddyEddySimoenRooyackers, RitaRitaRooyackersCollaert, NadineNadineCollaertClaeys, CorCorClaeys2021-10-172021-10-172008https://imec-publications.be/handle/20.500.12860/14287Comparison between analog performance of standard and strained triple-gate nFinFETsProceedings paper