Generic learning of TDDB applied to RRAM for improved understanding of conduction and switching mechanism through multiple filaments

Degraeve, RobinRobinDegraeveRoussel, PhilippePhilippeRousselGoux, LudovicLudovicGouxWouters, DirkDirkWoutersKittl, JorgeJorgeKittlAltimime, LaithLaithAltimimeJurczak, GosiaGosiaJurczakGroeseneken, GuidoGuidoGroeseneken2021-10-182021-10-182010https://imec-publications.be/handle/20.500.12860/16997Generic learning of TDDB applied to RRAM for improved understanding of conduction and switching mechanism through multiple filamentsProceedings paper