Vasina, PetrPetrVasinaSikula, J.J.SikulaSimoen, EddyEddySimoenClaeys, C.C.Claeys2021-09-292021-09-291995https://imec-publications.be/handle/20.500.12860/982A Low-Frequency Noise Study of Hot-Carrier Stressing Effects in Submicron Si p-MOSFETsOral presentation