Excess carrier density variations in test structures for photoconductance-based contact recombination current measurements

Deckers, JanJanDeckersDebucquoy, MaartenMaartenDebucquoyGordon, IvanIvanGordonMertens, RobertRobertMertensPoortmans, JefJefPoortmans2021-10-222021-10-2220152156-3381https://imec-publications.be/handle/20.500.12860/25167Excess carrier density variations in test structures for photoconductance-based contact recombination current measurementsJournal articlehttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7042742