Recent trends in reliability assessment of advanced CMOS technologies

Groeseneken, GuidoGuidoGroesenekenDegraeve, RobinRobinDegraeveKaczer, BenBenKaczerRoussel, PhilippePhilippeRoussel2021-10-162021-10-162005-04https://imec-publications.be/handle/20.500.12860/10526Recent trends in reliability assessment of advanced CMOS technologiesProceedings paper