Demonstration of low-frequency noise measurements for studying electromigration mechanisms in advanced nano-scaled interconnects

Beyne, SofieSofieBeyneCroes, KristofKristofCroesDe Wolf, IngridIngridDe WolfTokei, ZsoltZsoltTokei2021-10-242021-10-242017https://imec-publications.be/handle/20.500.12860/27848Demonstration of low-frequency noise measurements for studying electromigration mechanisms in advanced nano-scaled interconnectsProceedings paperhttp://ieeexplore.ieee.org/document/7985989/