Ferain, IsabelleIsabelleFerainPantisano, LuigiLuigiPantisanoKottantharayil, AnilAnilKottantharayilPetry, JasmineJasminePetryTrojman, LionelLionelTrojmanCollaert, NadineNadineCollaertJurczak, GosiaGosiaJurczakDe Meyer, KristinKristinDe Meyer2021-10-162021-10-162007https://imec-publications.be/handle/20.500.12860/12151Reduction of the anomalous VT behavior in MOSFETs with High-k/metal gate stacksJournal article